Archive for May, 2011
17th May, 2011
ATL Security Label Systems™, was established in 2007 to provide an advanced new line of labels, offering security and anti-counterfeiting features, including invisible digital forensic marking, track and trace, mass serialization, custom codes, 2D barcodes, color shifting authentication, covert “machine readable” markers, and anti-microbial labels and packaging. To help maintain the company’s proud reputation for the excellence of its products, regular investments are made in state-of-the-art inspection equipment illustrated by the recent purchase of an advanced Kestrel 200, optical measuring microscope from Vision Engineering.
Tags: Die Accuracy, Die Measurement, Die Quality, Dimensional Accuracy of Dies, Measurement of Dies, Optical 2-axis Measurement, Quality Control of Dies Posted in General, Measuring Microscopes, Optical Measurement | No Comments »
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LATEST NEWS
From their award winning Mantis stereo microscope with 'eyepieceless' viewer to their a [more]
Vision Engineering Inc has recently hired two new District Managers to coordinate sales [more]
Designed to be a low cost solution to a wide range of inspection tasks, the SX25 provid [more]
ATL Security Label Systems™, was established in 2007 to provide an advanced new line [more]
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